Stabilizing Open-Set Test-Time Adaptation via Primary-Auxiliary Filtering and Knowledge-Integrated Prediction


Byung-Joon Lee (Sungkyunkwan University), Jin-Seop Lee (Sungkyunkwan University), Jee-Hyong Lee (Sungkyunkwan University)
The 35th British Machine Vision Conference

Abstract

Deep neural networks demonstrate strong performance under aligned training-test distributions. However, real-world test data often exhibit domain shifts. Test-Time Adaptation (TTA) addresses this challenge by adapting the model to test data during inference. While most TTA studies assume that the training and test data share the same class set (closed-set TTA), real-world scenarios often involve open-set data (open-set TTA), which can degrade closed-set accuracy. A recent study showed that identifying open-set data during adaptation and maximizing its entropy is an effective solution. However, the previous method relies on the source model for filtering, resulting in suboptimal filtering accuracy on domain-shifted test data. In contrast, we found that the adapting model, which learns domain knowledge from noisy test streams, tends to be unstable and leads to error accumulation when used for filtering. To address this problem, we propose Primary-Auxiliary Filtering (PAF), which employs an auxiliary filter to validate data filtered by the primary filter. Furthermore, we propose Knowledge-Integrated Prediction (KIP), which calibrates the outputs of the adapting model, EMA model, and source model to integrate their complementary knowledge for OSTTA. We validate our approach across diverse closed-set and open-set datasets. Our method enhances both closed-set accuracy and open-set discrimination over existing methods. The code is available at https://github.com/powerpowe/PAF-KIP-OSTTA.

Citation

@inproceedings{Lee_2025_BMVC,
author    = {Byung-Joon Lee and Jin-Seop Lee and Jee-Hyong Lee},
title     = {Stabilizing Open-Set Test-Time Adaptation via Primary-Auxiliary Filtering and Knowledge-Integrated Prediction},
booktitle = {36th British Machine Vision Conference 2025, {BMVC} 2025, Sheffield, UK, November 24-27, 2025},
publisher = {BMVA},
year      = {2025},
url       = {https://bmva-archive.org.uk/bmvc/2025/assets/papers/Paper_1071/paper.pdf}
}


Copyright © 2025 The British Machine Vision Association and Society for Pattern Recognition
The British Machine Vision Conference is organised by The British Machine Vision Association and Society for Pattern Recognition. The Association is a Company limited by guarantee, No.2543446, and a non-profit-making body, registered in England and Wales as Charity No.1002307 (Registered Office: Dept. of Computer Science, Durham University, South Road, Durham, DH1 3LE, UK).

Imprint | Data Protection