Segmentation Assisted Incremental Test Time Adaptation in an Open World


Manogna Sreenivas (Indian Institute of Science), Soma Biswas (Indian Institute of Science)
The 35th British Machine Vision Conference

Abstract

In dynamic environments, unfamiliar objects and distribution shifts are often encountered which challenge the generalization abilities of the deployed trained models. This work addresses Incremental Test Time Adaptation (ITTA) of Vision-Language Models (VLMs), tackling scenarios where unseen classes and unseen domains continuously appear during testing. Unlike traditional Test Time Adaptation approaches where the test samples come only from a predefined set of classes, our framework allows models to adapt simultaneously to both covariate and label shifts, actively incorporating new classes as they emerge. Towards this goal, we establish a new benchmark for ITTA, integrating single-image TTA methods for VLMs with active labeling to query an oracle for samples potentially representing unseen classes during test time. We propose a segmentation assisted active labeling module, termed SegAssist, which is training-free and repurposes the VLM’s segmentation capabilities to refine active sample selection, prioritizing samples likely to belong to unseen classes. Extensive experiments on several benchmark datasets demonstrate the potential of SegAssist to enhance the performance of VLMs in real-world scenarios, where continuous adaptation to emerging data is essential.

Citation

@inproceedings{Sreenivas_2025_BMVC,
author    = {Manogna Sreenivas and Soma Biswas},
title     = {Segmentation Assisted Incremental Test Time Adaptation in an Open World},
booktitle = {36th British Machine Vision Conference 2025, {BMVC} 2025, Sheffield, UK, November 24-27, 2025},
publisher = {BMVA},
year      = {2025},
url       = {https://bmva-archive.org.uk/bmvc/2025/assets/papers/Paper_632/paper.pdf}
}


Copyright © 2025 The British Machine Vision Association and Society for Pattern Recognition
The British Machine Vision Conference is organised by The British Machine Vision Association and Society for Pattern Recognition. The Association is a Company limited by guarantee, No.2543446, and a non-profit-making body, registered in England and Wales as Charity No.1002307 (Registered Office: Dept. of Computer Science, Durham University, South Road, Durham, DH1 3LE, UK).

Imprint | Data Protection